ANFF-Qld Facility welcomed Dr. Shamim Shahrokhi , the Anton Paar Technical Sales Specialist (Characterisation) for Australia and New Zealand, 28th May 2024 who presented a seminar about their Hit 300 nanoindentation instrument for Mechanical Surface Characterisation, to ANFF-Qld Facility users and the public. Hit 300 is a premium yet highly affordable nanohardness tester built for every user … Read more “Anton Paar presents Nanoindentation with Hit 300 platform”
Seminar
First of it’s kind in Australia! Next Generation Nano 3D printing
The Australian National Fabrication Facility – Queensland Node (ANFF-Qld), based at The University of Queensland, is excited to launch the next generation nano 3D printing tool MPO 100 based on Two-Photon Polymerization in our new, shiny and renovated cleanroom. The system, developed by Multiphoton Optics GmbH and manufactured by its parent company Heidelberg Instruments, will … Read more “First of it’s kind in Australia! Next Generation Nano 3D printing”
Nanoscale 3D printing technical seminar
ANFF-Q is excited to welcome Henrik Akesson, the Executive Sales Manager APAC for Nanoscribe. Henrik will be giving a presentation on the highest resolution 3D printing in research and prototyping. The technical seminar will be followed by a Q&A morning tea. For more information and to register, go to the event page.
What would you like to see at ANFF-Q in the future?
ANFF-Q has been awarded $18.36 million to spend over the next 4 years to upgrade and expand our facilities so that we can continue to support research excellence in Australia. We’re inviting current, past and potential users to attend our ANFF-Q User Meetings on Monday 11 November. In these meeting we will discuss our future … Read more “What would you like to see at ANFF-Q in the future?”
Litesizer seminar and demonstrations – bring your own samples
ANFF-Q will be hosting a new Anton Paar Litesizer™ 500 from Wednesday 23 October until Friday 8 November. To help us make the most of this incredible instrument, we have invited Dr Neeraj Mishra from Anton Paar to present a seminar on Dynamic, Electrophoretic and Static Light Scattering (DLS, ELS, SLS) technologies and how they can be applied to different samples. The … Read more “Litesizer seminar and demonstrations – bring your own samples”
An evolution of size exclusion chromatography and gel permeation chromatography
ANFF-Q will be hosting a presentation from guest speaker Michael Gray, Support Specialist at Waters Australia Pty Ltd. The seminar will cover the fundamentals and challenges of size exclusion chromatography (SEC) and gel permeation chromatography (GPC). The Waters Advanced Polymer Chromatography (APC) System solves many of the challenges of SEC and GPC analysis as well as addressing modern analytical requirements demanded by … Read more “An evolution of size exclusion chromatography and gel permeation chromatography”
Advanced Atomic Force Microscopy seminar series
ANFF-Q will be hosting a new Bruker Dimension ICON Atomic Force Microscope (AFM) from Thursday 2 May until Friday 10 May. To help us make the most of this marvellous machine, we have invited Christian Gow from Coherent Scientific to present a seminar series on advanced AFM techniques. Additionally, private demonstrations of the instrument will be available each … Read more “Advanced Atomic Force Microscopy seminar series”
Atomic Force Microscopy seminar, demo and workshops
ANFF-Q will be hosting a new Park NX10 Atomic Force Microscope (AFM) from Tuesday 12 March until Friday 22 March, allowing researchers to come and try the machine on their own samples. AFM has wide applications in Material Science, Life Science, Nanotech and Electronics. AFM can be used for imaging, force measurement and manipulation of samples. This is … Read more “Atomic Force Microscopy seminar, demo and workshops”
Peak Performance with Atomic Force Microscopy
This workshop caters to the continuously growing demand of researchers, confronted with new materials and research topics, for complex nano-surface analysis. The workshop will cover: Basic theoretical concept of Atomic Force Microscopy (AFM) and its measuring principle Key steps on your way to peak performance Applications of AFM such as material sciences, life sciences, polymers, … Read more “Peak Performance with Atomic Force Microscopy”
Technical Seminar: Chemical Vapour Deposition
Dielectric layers such as silicon oxide (SiOx) and silicon nitride (SiNx) play an important role in the semiconductor industry. Chemical vapour deposition (CVD) is a popular technology for depositing dielectrics, particularly plasma-enhanced CVD (PECVD). PECVD is economically viable with high deposition rate (tens of nm min−1) and is very attractive for compound semiconductors as it is possible to obtain … Read more “Technical Seminar: Chemical Vapour Deposition”
