Advanced Atomic Force Microscopy seminar series

ANFF-Q will be hosting a new Bruker Dimension ICON Atomic Force Microscope (AFM) from Thursday 2 May until Friday 10 May. To help us make the most of this marvellous machine, we have invited Christian Gow from Coherent Scientific to present a seminar series on advanced AFM techniques. Additionally, private demonstrations of the instrument will be available each day by appointment, and we invite you to bring your samples.

Christian is a Bruker-trained AFM applications scientist with a focus on nano, micro, and macro-scale imaging and testing using AFM, nanoindentation, tribology and optical techniques. Christian has over 12 yrs experience in AFM and nanoindentation.

For more information, or to register, go to the event page.