ANFF-Q will be hosting a new Park NX10 Atomic Force Microscope (AFM) from Tuesday 12 March until Friday 22 March, allowing researchers to come and try the machine on their own samples.

AFM has wide applications in Material Science, Life Science, Nanotech and Electronics. AFM can be used for imaging, force measurement and manipulation of samples. This is achieved through the application and measurement of atomic forces between the tip of the AFM probe and the sample surface. Dr ZiBin Chen, Scitek Application Scientist, will give a seminar to introduce the principles of AFM, its potential applications and the specialist features of the Park NX10 AFM, including the SmartScan Auto Mode.

The seminar will be followed by an extended Q&A session, an instrument demonstration and a series of workshops.

See the event page for details.