Advanced Atomic Force Microscopy seminar series

Event Date: 02/05/2019

Event Time: 10:00am

ANFF-Q will be hosting a new Bruker Dimension ICON Atomic Force Microscope (AFM) from Thursday 2 May until Friday 10 May in our PC2 facility located within the AIBN, UQ. To help us make the most of this marvellous machine, we have invited Christian Gow from Coherent Scientific to present a seminar series on advanced AFM techniques. Additionally, private demonstrations of the instrument will be available each day by appointment, and we invite you to bring your samples.

Christian is a Bruker-trained AFM applications scientist with a focus on nano, micro, and macro-scale imaging and testing using AFM, nanoindentation, tribology and optical techniques. Christian has over 12 yrs experience in AFM and nanoindentation.

Places are limited so make sure you register: 

Thursday, 2 May — Introduction to Bruker Dimension ICON

  • 10.00am – 10.30am — Seminar — Register
  • 10:30am – 11:30am — Q&A Morning Tea — Register
  • 1:30pm – 4:00pm — Demonstration 1

Friday, 3 May — High resolution nanomechanical imaging with PeakForce QNM

  • 10.00am – 10.30am — Seminar — Register
  • 11:00am – 1:00pm — Demonstration 2
  • 2:00pm – 4:00pm — Demonstration 3

Tuesday 7 May — Full-spectrum contact resonance mechanical mapping of stiff materials

  • 10.00am – 10.30am — Seminar — Register
  • 11:00am – 1:00pm — Demonstration 4
  • 2:00pm – 4:00pm — Demonstration 5

Wednesday 8 May — True full range viscoelastic property measurement with AFM-nanoDMA

  • 10.00am – 10.30am — Seminar — Register
  • 11:00am – 1:00pm — Demonstration 6
  • 2:00pm – 4:00pm — Demonstration 7

Thursday 9 May — DataCube multivariant nanoelectrical mapping with electrical spectroscopy

  • 10.00am – 10.30am — Seminar — Register
  • 11:00am – 1:00pm — Demonstration 8
  • 2:00pm – 4:00pm — Demonstration 9

Friday 10 May — PeakForce SECM: True nano scale surface reactivity with Bruker’s nanoElectrode probe

  • 10.00am – 10.30am — Seminar — Register
  • 11:00am – 1:00pm — Demonstration 10
  • 2:00pm – 4:00pm — Demonstration 11

Workshops — bring your own sample!

The new Bruker Dimension ICON AFM will be set-up to try on your own samples. Workshops will be held every afternoon from Thursday 2 May until Friday 10 May. Each workshop will be for a particular type of samples and techniques. To register to attend a workshop, please email Christian Gow or Elena Taran with details of your sample and the technique you are interested in trying.