thermal-analysis-characterisation-suite-mettler-toledo-dsc-1-brochure
Facilities
- Computer-aided design (CAD)
- Deposition
- Device testing
- Etching
- Imaging & surface characterisation
- Atomic force microscopy suite
- Confocal laser scanning microscopy suite
- KLA P-7 Stylus Profiler
- JEOL IT-300 scanning electron microscope (SEM)
- Jeol NeoScope scanning electron microscope (SEM)
- Leica microscope
- Nikon Eclipse Ti-U inverted microscope
- Renishaw inVia Raman
- SCI FilmTek 2000M
- SurPASS electrokinetic analyser for solid surface analysis
- VUV-VASE ellipsometer
- Zeiss microscope
- Zeta 300 3D optical profiler
- Lithography
- Material characterisation
- Aqueous gel permeation chromatography system (GPC)
- Gel permeation chromatography system (GPC)
- Laser light scattering spectrometry system
- Liquid chromatography mass spectrometry (LC-MS)
- Litesizer 500
- Thermal analysis characterisation suite (DMA, DSC, TGA)
- UV plate reader
- Vibrational spectroscopy suite (FTIR and Raman)
- Synthesis
- Proxy facilities
- Instrument list and contacts
