Peak Performance with Atomic Force Microscopy

Event Date: 11/12/2018

Event Time: 3:00pm

This workshop caters to the continuously growing demand of researchers, confronted with new materials and research topics, for complex nano-surface analysis.

The workshop will cover:

  • Basic theoretical concept of Atomic Force Microscopy (AFM) and its measuring principle
  • Key steps on your way to peak performance
  • Applications of AFM such as material sciences, life sciences, polymers, coatings, hard metallic and ceramic systems, semiconductors and soft organic materials

An extended Q&A session will follow the workshop, allowing you to discuss AFM techniques that apply to your research.

Bring your own sample!

The new Tosca 400™ will be set-up for you to try. An exciting new entry into the AFM marketplace, the Tosca 400™ uniquely combines premium technology with a high level of automation and usability.


Dr. Ashish Kumar is Market Manager for the Characterisation product portfolio at Anton Paar Australia and Anton Paar New Zealand, including Rheometry, Mechanical Surface Testing, Particle Characterisation, Pore Size Analysis and Nanosurface Properties. He is responsible for technical support, application testing, product management and marketing activities for the different product lines, and has been since 2013. He holds a PhD in Chemical Engineering from The University of Melbourne (Australia) and has nine years of rheology experience.

Places are limited, so make sure you RSVP.

Tuesday, 11 December 2018
Seminar: 3.00pm – 3.30pm
Hands-on Workshop: 3.30pm – 4.30pm
Q&A Afternoon Tea: 4.30pm – 5.00pm

Level 1, Seminar Room
​AIBN building (#75)
The University of Queensland
St Lucia    4072
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