The Zeta 300 is a multi-mode optical profiler with a fully integrated, metrology platform that allows automatic data acquisition and analysis for very complicated structures.
Budi Hartono, the Zeta Applications Engineer Manager, will speak about surface profiling techniques and the potential applications for this new multi-mode optical profiler:
- Micro-needle and high aspect ratio trenches
- Advanced wafer level packaging
- Solar cell surface profiling
The seminar will be followed by afternoon tea and an opportunity to talk about your research with the Zeta and ANFF-Q optical profiling specialists.
Make sure you RSVP.