ANFF-Q will be hosting a new Park NX10 Atomic Force Microscope (AFM) from Tuesday 12 March until Friday 22 March, allowing researchers to come and try the machine on their own samples.

AFM has wide applications in Material Science, Life Science, Nanotech and Electronics. AFM can be used for imaging, force measurement and manipulation of samples. This is achieved through the application and measurement of atomic forces between the tip of the AFM probe and the sample surface. The Park NX10 AFM offers unique benefits to users with ease of use features, SmartScan Auto Mode, cross talk elimination, producing data at the highest nano resolution that you can trust, replicate and publish with unparalleled accuracy.

Learn more about potential applications:

Dr ZiBin Chen, Scitek Application Scientist, will give a seminar to introduce the principles of AFM, its potential applications and the specialist features of the Park NX10 AFM, including the SmartScan Auto Mode.

The seminar will be followed by an extended Q&A session and instrument demonstration. Current measurement modes available for the demonstration include:

• Contact & True Non-contact modes.
• In-liquid imaging.
• 3D topography with in-situ heating capability.
• Piezoelectric Force Microscopy (PFM).
• Dynamic Contact – EFM (DC-EFM) — this is an enhanced EFM technique (one-pass surface potential mapping) that is patented by Park Systems and very similar to PFM.
• Scanning Kelvin Probe Microscopy (SKPM).
• Magnetic Force Microscopy (MFM) — mapping of the magnetic force between the magnetised tip and the sample.
• Force Modulation Microscopy (FMM), which is used to detect variations in the mechanical properties of the samples surface such as elasticity, adhesion and friction.

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