The new Dimension ICON XR AFM expands the capability at the ANFF-Q for imaging, with fast setup to test, access to larger sample sizes and wafers, and rapid and simple multiple site sample measurement for high volume screening applications, both quickly and easily achievable.
The Dimension XR includes a number of advanced features available across a range of nanomechanical and nanoelectrical techniques, including PeakForce Quantitative Nanomechanical Mapping, FastForce Volume Contact Resonance, PeakForce based Tunnelling Conductive AFM (TUNA) and Kelvin Probe Force Microscopy, TUNA and Piezoresonse Force DataCUBE hyperspectral nanoelectrical mapping, and liquid nanoelectrical capability.
If you would like to access the Dimension XR AFM, please email ANFF-Q Professional Officer Dr Kinnari Shelat.
2:00pm – 3:00pm
Thursday, 10 December 2020
Christian Gow is a sales and product specialist working with Coherent Scientific (representing Bruker NanoSurfaces in Australia and New Zealand). Christian is based in Brisbane, and has been involved in the sales and support of AFM instrumentation for over a decade.